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Editors
See all (29)yuya kajikawa
Tokyo Institute of Technology
Meguro City, Japan
Specialty Chief Editor
Patent Analytics
chih-hung hsieh
College of Management, Yuan Ze University
Zhong-li, Taoyuan, Taiwan
Associate Editor
Patent Analytics
wonjoon kim
Korea Advanced Institute of Science and Technology (KAIST)
Daejeon, South Korea
Associate Editor
Patent Analytics
antonio messeni petruzzelli
Politecnico di Bari
Bari, Italy
Associate Editor
Patent Analytics
